The USB subsystem has a few counters that need to be reset since they are stored in static variables rather than driver-model data. An example is usb_max_devs. Ultimately we should move this data into the USB uclass.
For now, make sure that USB is reset after each test, so that the counters go back to zero.
Note: this is not a perfect solution: It a USB test fails it will exit immediately and leave USB un-reset. The impact here is that it may cause subsequence test failures in the same run.
Signed-off-by: Simon Glass sjg@chromium.org ---
test/dm/usb.c | 2 ++ 1 file changed, 2 insertions(+)
diff --git a/test/dm/usb.c b/test/dm/usb.c index 5531606..157e9f4 100644 --- a/test/dm/usb.c +++ b/test/dm/usb.c @@ -52,6 +52,7 @@ static int dm_test_usb_flash(struct unit_test_state *uts) memset(cmp, '\0', sizeof(cmp)); ut_asserteq(2, blk_dread(dev_desc, 0, 2, cmp)); ut_assertok(strcmp(cmp, "this is a test")); + ut_assertok(usb_stop());
return 0; } @@ -67,6 +68,7 @@ static int dm_test_usb_multi(struct unit_test_state *uts) ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 0, &dev)); ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 1, &dev)); ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 2, &dev)); + ut_assertok(usb_stop());
return 0; }