Commit 35c204d8a9d0 (nand: reinstate lazy bad block scanning) broke NAND_BBT_USE_FLASH feature.
Its git-log claimed that it reinstated the change as by commit fb49454b1b6c ("nand: reinstate lazy bad block scanning"), but it moved "chip->options |= NAND_BBT_SCANNED" below "chip->scan_bbt(mtd);".
It causes recursion if scan_bbt does not find a flash based BBT and tries to write one, and the attempt to erase the BBT area causes a bad block check.
Reinstate commit ff49ea8977b5 (NAND: Mark the BBT as scanned prior to calling scan_bbt.).
Signed-off-by: Masahiro Yamada yamada.m@jp.panasonic.com Cc: Rostislav Lisovy lisovy@merica.cz Cc: Heiko Schocher hs@denx.de Cc: Scott Wood scottwood@freescale.com ---
drivers/mtd/nand/nand_base.c | 2 +- 1 file changed, 1 insertion(+), 1 deletion(-)
diff --git a/drivers/mtd/nand/nand_base.c b/drivers/mtd/nand/nand_base.c index d04c7ea..eaa4be1 100644 --- a/drivers/mtd/nand/nand_base.c +++ b/drivers/mtd/nand/nand_base.c @@ -635,8 +635,8 @@ static int nand_block_checkbad(struct mtd_info *mtd, loff_t ofs, int getchip, struct nand_chip *chip = mtd->priv;
if (!(chip->options & NAND_BBT_SCANNED)) { - chip->scan_bbt(mtd); chip->options |= NAND_BBT_SCANNED; + chip->scan_bbt(mtd); }
if (!chip->bbt)