Rework this function such that the code is more readable. Zap unused parameter "num_tries" while at it. Also wrap parameter "bit_chk" into this function as it's value is not used outside. Finally, fix the return value from this function to match the common expectation, where 0 means success.
Signed-off-by: Marek Vasut marex@denx.de --- drivers/ddr/altera/sequencer.c | 96 ++++++++++++++++++++++-------------------- 1 file changed, 50 insertions(+), 46 deletions(-)
diff --git a/drivers/ddr/altera/sequencer.c b/drivers/ddr/altera/sequencer.c index e17e601..8674a05 100644 --- a/drivers/ddr/altera/sequencer.c +++ b/drivers/ddr/altera/sequencer.c @@ -1036,31 +1036,42 @@ static void rw_mgr_mem_handoff(void) */ }
-/* - * performs a guaranteed read on the patterns we are going to use during a - * read test to ensure memory works +/** + * rw_mgr_mem_calibrate_read_test_patterns() - Read back test patterns + * @rank_bgn: Rank number + * @group: Read/Write Group + * @all_ranks: Test all ranks + * + * Performs a guaranteed read on the patterns we are going to use during a + * read test to ensure memory works. */ -static uint32_t rw_mgr_mem_calibrate_read_test_patterns(uint32_t rank_bgn, - uint32_t group, uint32_t num_tries, uint32_t *bit_chk, - uint32_t all_ranks) +static int +rw_mgr_mem_calibrate_read_test_patterns(const u32 rank_bgn, const u32 group, + const u32 all_ranks) { - uint32_t r, vg; - uint32_t correct_mask_vg; - uint32_t tmp_bit_chk; - uint32_t rank_end = all_ranks ? RW_MGR_MEM_NUMBER_OF_RANKS : - (rank_bgn + NUM_RANKS_PER_SHADOW_REG); - uint32_t addr; - uint32_t base_rw_mgr; + const u32 addr = SDR_PHYGRP_RWMGRGRP_ADDRESS | + RW_MGR_RUN_SINGLE_GROUP_OFFSET; + const u32 addr_offset = + (group * RW_MGR_MEM_VIRTUAL_GROUPS_PER_READ_DQS) << 2; + const u32 rank_end = all_ranks ? + RW_MGR_MEM_NUMBER_OF_RANKS : + (rank_bgn + NUM_RANKS_PER_SHADOW_REG); + const u32 shift_ratio = RW_MGR_MEM_DQ_PER_READ_DQS / + RW_MGR_MEM_VIRTUAL_GROUPS_PER_READ_DQS; + const u32 correct_mask_vg = param->read_correct_mask_vg;
- *bit_chk = param->read_correct_mask; - correct_mask_vg = param->read_correct_mask_vg; + u32 tmp_bit_chk, base_rw_mgr, bit_chk; + int vg, r; + int ret = 0; + + bit_chk = param->read_correct_mask;
for (r = rank_bgn; r < rank_end; r++) { + /* Request to skip the rank */ if (param->skip_ranks[r]) - /* request to skip the rank */ continue;
- /* set rank */ + /* Set rank */ set_rank_and_odt_mask(r, RW_MGR_ODT_MODE_READ_WRITE);
/* Load up a constant bursts of read commands */ @@ -1073,38 +1084,36 @@ static uint32_t rw_mgr_mem_calibrate_read_test_patterns(uint32_t rank_bgn, &sdr_rw_load_jump_mgr_regs->load_jump_add1);
tmp_bit_chk = 0; - for (vg = RW_MGR_MEM_VIRTUAL_GROUPS_PER_READ_DQS-1; ; vg--) { - /* reset the fifos to get pointers to known state */ - + for (vg = RW_MGR_MEM_VIRTUAL_GROUPS_PER_READ_DQS - 1; + vg >= 0; vg--) { + /* Reset the FIFOs to get pointers to known state. */ writel(0, &phy_mgr_cmd->fifo_reset); writel(0, SDR_PHYGRP_RWMGRGRP_ADDRESS | RW_MGR_RESET_READ_DATAPATH_OFFSET); - - tmp_bit_chk = tmp_bit_chk << (RW_MGR_MEM_DQ_PER_READ_DQS - / RW_MGR_MEM_VIRTUAL_GROUPS_PER_READ_DQS); - - addr = SDR_PHYGRP_RWMGRGRP_ADDRESS | RW_MGR_RUN_SINGLE_GROUP_OFFSET; - writel(RW_MGR_GUARANTEED_READ, addr + - ((group * RW_MGR_MEM_VIRTUAL_GROUPS_PER_READ_DQS + - vg) << 2)); + writel(RW_MGR_GUARANTEED_READ, + addr + addr_offset + (vg << 2));
base_rw_mgr = readl(SDR_PHYGRP_RWMGRGRP_ADDRESS); - tmp_bit_chk = tmp_bit_chk | (correct_mask_vg & (~base_rw_mgr)); - - if (vg == 0) - break; + tmp_bit_chk <<= shift_ratio; + tmp_bit_chk |= correct_mask_vg & ~base_rw_mgr; } - *bit_chk &= tmp_bit_chk; + + bit_chk &= tmp_bit_chk; }
- addr = SDR_PHYGRP_RWMGRGRP_ADDRESS | RW_MGR_RUN_SINGLE_GROUP_OFFSET; writel(RW_MGR_CLEAR_DQS_ENABLE, addr + (group << 2));
set_rank_and_odt_mask(0, RW_MGR_ODT_MODE_OFF); - debug_cond(DLEVEL == 1, "%s:%d test_load_patterns(%u,ALL) => (%u == %u) =>\ - %lu\n", __func__, __LINE__, group, *bit_chk, param->read_correct_mask, - (long unsigned int)(*bit_chk == param->read_correct_mask)); - return *bit_chk == param->read_correct_mask; + + if (bit_chk != param->read_correct_mask) + ret = -EIO; + + debug_cond(DLEVEL == 1, + "%s:%d test_load_patterns(%u,ALL) => (%u == %u) => %i\n", + __func__, __LINE__, group, bit_chk, + param->read_correct_mask, ret); + + return ret; }
/** @@ -2200,7 +2209,6 @@ static uint32_t rw_mgr_mem_calibrate_vfifo_center(uint32_t rank_bgn, static int rw_mgr_mem_calibrate_guaranteed_write(const u32 rw_group, const u32 phase) { - u32 bit_chk; int ret;
/* Set a particular DQ/DQS phase. */ @@ -2223,16 +2231,12 @@ static int rw_mgr_mem_calibrate_guaranteed_write(const u32 rw_group, * Altera EMI_RM 2015.05.04 :: Figure 1-26 * Back-to-Back reads of the patterns used for calibration. */ - ret = rw_mgr_mem_calibrate_read_test_patterns(0, rw_group, 1, - &bit_chk, 1); - if (!ret) { /* FIXME: 0 means failure in this old code :-( */ + ret = rw_mgr_mem_calibrate_read_test_patterns(0, rw_group, 1); + if (ret) debug_cond(DLEVEL == 1, "%s:%d Guaranteed read test failed: g=%u p=%u\n", __func__, __LINE__, rw_group, phase); - return -EIO; - } - - return 0; + return ret; }
/**