Add sample dm clk test for clk_get_by_index and clk_get_by_index_nodev functionality code.
Cc: Stephen Warren swarren@nvidia.com Signed-off-by: Jagan Teki jagan@amarulasolutions.com Reviewed-by: Simon Glass sjg@chromium.org --- test/dm/clk.c | 21 +++++++++++++++++++++ 1 file changed, 21 insertions(+)
diff --git a/test/dm/clk.c b/test/dm/clk.c index 898c034e27..29ef6ef41b 100644 --- a/test/dm/clk.c +++ b/test/dm/clk.c @@ -4,12 +4,33 @@ */
#include <common.h> +#include <clk.h> #include <dm.h> #include <asm/clk.h> #include <dm/test.h> #include <linux/err.h> #include <test/ut.h>
+/* Base test of the clk uclass */ +static int dm_test_clk_base(struct unit_test_state *uts) +{ + struct udevice *dev; + struct clk clk_method1; + struct clk clk_method2; + + /* Get the device using the clk device */ + ut_assertok(uclass_get_device_by_name(UCLASS_MISC, "clk-test", &dev)); + + /* Get the same clk port in 2 different ways and compare */ + ut_assertok(clk_get_by_index(dev, 1, &clk_method1)); + ut_assertok(clk_get_by_index_nodev(dev_ofnode(dev), 1, &clk_method2)); + ut_asserteq(clk_method1.id, clk_method2.id); + + return 0; +} + +DM_TEST(dm_test_clk_base, DM_TESTF_SCAN_FDT); + static int dm_test_clk(struct unit_test_state *uts) { struct udevice *dev_fixed, *dev_clk, *dev_test;