Hi Vaibhav,
On Wednesday 03 October 2007, Vaibhav Hiremath wrote:
I have ported U-Boot-1.2.0 to ARM11176 core, which supports NAND booting (big page NAND device).
I have one query - How U-boot-1.2.0 handles bad block? As I understand at the booting time U-Boot-1.2.0 scans whole NAND device and maintains BBT. This absolutely fine with me, but what will happen if read operation fails after that, say page read has generated ECC error. U-Boot-1.2.0 doesn't mark this block as a bad block.
Correct. AFAIK, current U-Boot NAND code, doesn't support bad block marking at all.
Is this some kind of loop hole in U-Boot NAND support? Since there is no other cause appart from Write and Erase fail which will mark the blcok as a bad. Ideally it should mark that block as a bad for ECC error, since it's failing of read operation.
Yes, from my understanding this missing bad block marking is a problem that should be fixed.
Thanks for bringing this issue up. Now all we need is a patch to support this bad block management. ;)
Best regards, Stefan
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