Subject: [PATCH v4 10/13] clk: test: Provide unit test for clk_get_by_id() method
This commit provides sandbox unit test for clk_get_by_id() method.
To test it default test clocks setup had to be adjusted to emulate structure similar to clocks in the Common Clock Framework [CCF] (for iMX devices).
The clk_get_by_id() relies on dev->driver_data having the pointer to struct clk.
Signed-off-by: Lukasz Majewski lukma@denx.de
Changes in v4: None Changes in v3:
- New patch
arch/sandbox/include/asm/clk.h | 8 ++++++++ drivers/clk/clk_sandbox_test.c | 23 +++++++++++++++++++++++ test/dm/clk.c | 3 ++- 3 files changed, 33 insertions(+), 1 deletion(-)
diff --git a/arch/sandbox/include/asm/clk.h b/arch/sandbox/include/asm/clk.h index 2b1c49f783..90f925109f 100644 --- a/arch/sandbox/include/asm/clk.h +++ b/arch/sandbox/include/asm/clk.h @@ -63,6 +63,14 @@ int sandbox_clk_query_enable(struct udevice *dev, int id); */ int sandbox_clk_test_get(struct udevice *dev); /**
- sandbox_clk_test_get_by_id - Ask the sandbox clock test device to
+request its
- clocks by using clock id.
- @dev: The sandbox clock test (client) devivce.
- @return: 0 if OK, or a negative error code.
- */
+int sandbox_clk_test_get_by_id(struct udevice *dev); +/**
- sandbox_clk_test_get_bulk - Ask the sandbox clock test device to request
its
- clocks with the bulk clk API.
diff --git a/drivers/clk/clk_sandbox_test.c b/drivers/clk/clk_sandbox_test.c index e8465dbfad..4d276f55b9 100644 --- a/drivers/clk/clk_sandbox_test.c +++ b/drivers/clk/clk_sandbox_test.c @@ -34,6 +34,29 @@ int sandbox_clk_test_get(struct udevice *dev) return 0; }
+int sandbox_clk_test_get_by_id(struct udevice *dev) {
- struct sandbox_clk_test *sbct = dev_get_priv(dev);
- struct clk *clkp, *i2c_clk;
- ulong driver_data_bkp;
- const int id = 24;
- int ret, id_bkp;
- i2c_clk = &sbct->clks[SANDBOX_CLK_TEST_ID_I2C];
- id_bkp = i2c_clk->id;
- i2c_clk->id = id;
- driver_data_bkp = i2c_clk->dev->driver_data;
- i2c_clk->dev->driver_data = (ulong)i2c_clk;
- ret = clk_get_by_id(id, &clkp);
- i2c_clk->id = id_bkp;
- i2c_clk->dev->driver_data = driver_data_bkp;
- return ret;
+}
int sandbox_clk_test_get_bulk(struct udevice *dev) { struct sandbox_clk_test *sbct = dev_get_priv(dev); diff --git a/test/dm/clk.c b/test/dm/clk.c index f301ecbb45..1685532259 100644 --- a/test/dm/clk.c +++ b/test/dm/clk.c @@ -120,8 +120,9 @@ static int dm_test_clk(struct unit_test_state *uts) ut_asserteq(0, sandbox_clk_query_enable(dev_clk, SANDBOX_CLK_ID_SPI)); ut_asserteq(0, sandbox_clk_query_enable(dev_clk, SANDBOX_CLK_ID_I2C));
- ut_assertok(sandbox_clk_test_free(dev_test));
ut_asserteq(0, sandbox_clk_test_get_by_id(dev_test));
ut_assertok(sandbox_clk_test_free(dev_test)); return 0;
Reviewed-by: Peng Fan peng.fan@nxp.com
} DM_TEST(dm_test_clk, DM_TESTF_SCAN_FDT); -- 2.11.0