This commit provides sandbox unit test for clk_get_parent_rate() method.
For testing the default test clocks setup had to be adjusted to emulate structure similar to clocks in the Common Clock Framework [CCF] (for iMX devices).
The clk_get_parent_rate() relies on dev->driver_data having the pointer to proper struct clk. It uses internally clk_get_parent() method also tested by this test.
Signed-off-by: Lukasz Majewski lukma@denx.de
---
Changes in v3: - New patch
arch/sandbox/include/asm/clk.h | 8 ++++++++ drivers/clk/clk_sandbox_test.c | 26 ++++++++++++++++++++++++++ test/dm/clk.c | 1 + 3 files changed, 35 insertions(+)
diff --git a/arch/sandbox/include/asm/clk.h b/arch/sandbox/include/asm/clk.h index 90f925109f..1df9534236 100644 --- a/arch/sandbox/include/asm/clk.h +++ b/arch/sandbox/include/asm/clk.h @@ -79,6 +79,14 @@ int sandbox_clk_test_get_by_id(struct udevice *dev); */ int sandbox_clk_test_get_bulk(struct udevice *dev); /** + * sandbox_clk_test_get_parent_rate - Ask the sandbox clock test device to + * query a passed clock's parent rate. + * + * @dev: The sandbox clock test (client) devivce. + * @return: The rate of the clock + */ +ulong sandbox_clk_test_get_parent_rate(struct udevice *dev); +/** * sandbox_clk_test_get_rate - Ask the sandbox clock test device to query a * clock's rate. * diff --git a/drivers/clk/clk_sandbox_test.c b/drivers/clk/clk_sandbox_test.c index 4d276f55b9..8ea15614c1 100644 --- a/drivers/clk/clk_sandbox_test.c +++ b/drivers/clk/clk_sandbox_test.c @@ -64,6 +64,32 @@ int sandbox_clk_test_get_bulk(struct udevice *dev) return clk_get_bulk(dev, &sbct->bulk); }
+ulong sandbox_clk_test_get_parent_rate(struct udevice *dev) +{ + struct sandbox_clk_test *sbct = dev_get_priv(dev); + struct clk *i2c_clk, *parent_clk; + struct udevice *parent_bkp; + ulong rate; + + parent_clk = &sbct->clks[SANDBOX_CLK_TEST_ID_FIXED]; + i2c_clk = &sbct->clks[SANDBOX_CLK_TEST_ID_I2C]; + + parent_clk->dev->driver_data = (ulong)parent_clk; + parent_bkp = i2c_clk->dev->parent; + i2c_clk->dev->parent = parent_clk->dev; + + rate = clk_get_parent_rate(i2c_clk); + + i2c_clk->dev->parent = parent_bkp; + parent_clk->dev->driver_data = 0; + + /* Check if cache'd value is correct */ + if (parent_clk->rate != 1234) + return 0; + + return rate; +} + ulong sandbox_clk_test_get_rate(struct udevice *dev, int id) { struct sandbox_clk_test *sbct = dev_get_priv(dev); diff --git a/test/dm/clk.c b/test/dm/clk.c index 8b858cee01..94f475bd8e 100644 --- a/test/dm/clk.c +++ b/test/dm/clk.c @@ -100,6 +100,7 @@ static int dm_test_clk(struct unit_test_state *uts) ut_asserteq(0, sandbox_clk_query_enable(dev_clk, SANDBOX_CLK_ID_I2C));
ut_asserteq(0, sandbox_clk_test_get_by_id(dev_test)); + ut_asserteq(1234, sandbox_clk_test_get_parent_rate(dev_test));
ut_assertok(sandbox_clk_test_free(dev_test)); return 0;