uclass_probe_all uses uclass_first_device/uclass_next_device assigning the return value.
The interface for getting meaningful error is uclass_first_device_check/uclass_next_device_check, use it.
Also do not stop iteration when an error is encountered. Probing all devices includes those that happen to be after a failing device in the uclass order.
Fixes: a59153dfeb ("dm: core: add function uclass_probe_all() to probe all devices") Signed-off-by: Michal Suchanek msuchanek@suse.de --- v6: add test --- drivers/core/uclass.c | 12 +++++------- test/dm/test-fdt.c | 19 +++++++++++++++---- 2 files changed, 20 insertions(+), 11 deletions(-)
diff --git a/drivers/core/uclass.c b/drivers/core/uclass.c index 08d9ed82de..a591e22403 100644 --- a/drivers/core/uclass.c +++ b/drivers/core/uclass.c @@ -799,20 +799,18 @@ int uclass_pre_remove_device(struct udevice *dev) int uclass_probe_all(enum uclass_id id) { struct udevice *dev; - int ret; + int ret, err;
- ret = uclass_first_device(id, &dev); - if (ret || !dev) - return ret; + err = uclass_first_device_check(id, &dev);
/* Scanning uclass to probe all devices */ while (dev) { - ret = uclass_next_device(&dev); + ret = uclass_next_device_check(&dev); if (ret) - return ret; + err = ret; }
- return 0; + return err; }
int uclass_id_count(enum uclass_id id) diff --git a/test/dm/test-fdt.c b/test/dm/test-fdt.c index 012f2f455f..1f14513d9f 100644 --- a/test/dm/test-fdt.c +++ b/test/dm/test-fdt.c @@ -392,10 +392,10 @@ DM_TEST(dm_test_fdt_offset, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT | UT_TESTF_FLAT_TREE);
/** - * Test various error conditions with uclass_first_device() and - * uclass_next_device() + * Test various error conditions with uclass_first_device(), + * uclass_next_device(), and uclass_probe_all() */ -static int dm_test_first_next_device(struct unit_test_state *uts) +static int dm_test_first_next_device_probeall(struct unit_test_state *uts) { struct dm_testprobe_pdata *pdata; struct udevice *dev, *parent = NULL; @@ -428,9 +428,20 @@ static int dm_test_first_next_device(struct unit_test_state *uts) device_remove(parent, DM_REMOVE_NORMAL); ut_asserteq(-ENOENT, uclass_first_device(UCLASS_TEST_PROBE, &dev));
+ /* Now that broken devices are set up test probe_all */ + device_remove(parent, DM_REMOVE_NORMAL); + /* There are broken devices so an error should be returned */ + ut_assert(uclass_probe_all(UCLASS_TEST_PROBE) < 0); + /* but non-error device should be probed nonetheless */ + ut_assertok(uclass_get_device(UCLASS_TEST_PROBE, 2, &dev)); + ut_assert(dev_get_flags(dev) & DM_FLAG_ACTIVATED); + ut_assertok(uclass_get_device(UCLASS_TEST_PROBE, 3, &dev)); + ut_assert(dev_get_flags(dev) & DM_FLAG_ACTIVATED); + return 0; } -DM_TEST(dm_test_first_next_device, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT); +DM_TEST(dm_test_first_next_device_probeall, + UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
/* Test iteration through devices in a uclass */ static int dm_test_uclass_foreach(struct unit_test_state *uts)