Add sample dm reset test for reset_get_by_index and reset_get_by_index_nodev functionality code.
Cc: Stephen Warren swarren@nvidia.com Signed-off-by: Jagan Teki jagan@amarulasolutions.com Reviewed-by: Simon Glass sjg@chromium.org --- test/dm/reset.c | 23 +++++++++++++++++++++++ 1 file changed, 23 insertions(+)
diff --git a/test/dm/reset.c b/test/dm/reset.c index c02866a2f0..c61daed490 100644 --- a/test/dm/reset.c +++ b/test/dm/reset.c @@ -5,6 +5,7 @@
#include <common.h> #include <dm.h> +#include <reset.h> #include <dm/test.h> #include <asm/reset.h> #include <test/ut.h> @@ -15,6 +16,28 @@ /* This is the other reset phandle specifier handled by bulk */ #define OTHER_RESET_ID 2
+/* Base test of the reset uclass */ +static int dm_test_reset_base(struct unit_test_state *uts) +{ + struct udevice *dev; + struct reset_ctl reset_method1; + struct reset_ctl reset_method2; + + /* Get the device using the reset device */ + ut_assertok(uclass_get_device_by_name(UCLASS_MISC, "reset-ctl-test", + &dev)); + + /* Get the same reset port in 2 different ways and compare */ + ut_assertok(reset_get_by_index(dev, 1, &reset_method1)); + ut_assertok(reset_get_by_index_nodev(dev_ofnode(dev), 1, + &reset_method2)); + ut_asserteq(reset_method1.id, reset_method2.id); + + return 0; +} + +DM_TEST(dm_test_reset_base, DM_TESTF_SCAN_FDT); + static int dm_test_reset(struct unit_test_state *uts) { struct udevice *dev_reset;