While implementing the USB tests some strange failures crept in. I was not able to debug them at the time and they were seemingly independent of the USB tests. I then forgot about it.
I have now tracked these failures down. This series corrects them so that the driver model tests run from start to finish.
The main problems are:
- recursive calls to uclass device_unbind() are not handled from within uclass_destroy() - dm_test_uclass_before_ready() can stop sandbox from working correctly for tests that run after it
This series fixes these as well as a minor LCD console problem with sandbox. It also updates the driver model README for recently added tests.
Simon Glass (5): dm: core: Handle recursive unbinding of uclass devices dm: usb: Add a terminator to the string destructor list lcd: Call lcd_sync() after completing the scroll dm: Update the README to reflect the current test output dm: test: Don't clear global_data in dm_test_uclass_before_ready()
common/lcd_console.c | 2 +- doc/driver-model/README.txt | 58 ++++++++++++++++++++++++++++++++++++------ drivers/core/uclass.c | 12 +++++++-- drivers/usb/emul/sandbox_hub.c | 1 + test/dm/core.c | 6 +++-- 5 files changed, 66 insertions(+), 13 deletions(-)