Hi Heinrich,
On Tue, 10 Dec 2019 at 11:17, Heinrich Schuchardt xypron.glpk@gmx.de wrote:
On 12/10/19 1:58 PM, Simon Glass wrote:
Hi Heinrich,
On Sat, 9 Nov 2019 at 01:44, Heinrich Schuchardt xypron.glpk@gmx.de wrote:
Activate UEFI unit tests on the sandbox.
Signed-off-by: Heinrich Schuchardt xypron.glpk@gmx.de
configs/sandbox64_defconfig | 1 + configs/sandbox_defconfig | 1 + configs/sandbox_flattree_defconfig | 1 + configs/sandbox_spl_defconfig | 1 + 4 files changed, 4 insertions(+)
Unfortunately this slows down the testing too much, nearly doubling the time in my tests.
I think the EFI console tests need to be modified to run in C instead of all the drain_console() and p.timeout stuff. We need an effort to speed up the tests, but certainly cannot make them any slower.
Hello Simon,
thanks for pointing at the excessive timeout.
In test_efi_selftest_text_input() and test_efi_selftest_text_input_ex() we call drain_console() a lot indeed.
I am using the Python tests on real hardware. The text input and output on the test systems uses the serial console. Whether you use C or Python code to feed the serial adapter will not change the time needed to drain the console.
We expect less then 50 characters of output per test step. At 9600 baud draining 50 characters would require 52 ms.
So I would suggest that we add a parameter timeout to drain_console() which defaults to 1000 ms as currently. But in the test we can set it to 50 ms. p.timeout could be changed likewise.
What are your thoughts?
I think you might be missing my point.
I think as a matter of policy we should require that test run mostly on the device, with just the results being output. By using C I mean to write the test in C instead of Python - just do the same steps. E.g. do a lot of run_command() calls and check the results. This should be much faster.
Regards, Simon