Hi Simon,
On Wed, Apr 29, 2015 at 8:30 AM, Simon Glass sjg@chromium.org wrote:
Hi Joe,
On 28 April 2015 at 22:14, Joe Hershberger joe.hershberger@ni.com wrote:
The change to refactor these functions created a regression.
commit c1d6f91952d0761f61b0f0f96e4c7aa32eee2788 Author: Przemyslaw Marczak p.marczak@samsung.com Date: Wed Apr 15 13:07:17 2015 +0200 dm: core: add internal functions for getting the device without probe
With this change, the dm unit tests started failing with a probe error -22 in the dm_test_children test.
Test: dm_test_children test/dm/core.c:544, dm_test_children(): 0 == ret: Expected 0, got -22
This restores the original behavior which would avoid a probe on invalid device pointers.
Signed-off-by: Joe Hershberger joe.hershberger@ni.com
drivers/core/uclass.c | 8 ++++++-- 1 file changed, 6 insertions(+), 2 deletions(-)
Can you please check this - it is very similar to yours:
Yes, it looks like it solves the same problem. I don't care which way it gets solved. Looks like yours is already on the way in. Hopefully sooner than later.
At what point will we make the tests be a gating factor for pulling patches, kinda like checkpatch.pl?
Thanks, -Joe