Dear Mike Frysinger,
In message 201105101711.07625.vapier@gentoo.org you wrote:
This adds a simple parallel nor flash test to automatically verify erasing/writing/reading of sectors. The code is based on existing Blackfin tests but generalized for everyone to use.
What exactly does the "parallel" in "parallel nor flash test" mean?
how it is connected to the processor
Are there any other types of NOR flashes? I mean, I have never heard anybody use this term before. Maybe we can just omit it - I find it more confusing than helpful.
- unsigned char *ret = (void *)CONFIG_SYS_SDRAM_BASE;
This will not work on many systems. For example, on PPC you will overwrite the exception vectors in low memory, thus crashing the system.
this is how the default memory post test works. it writes all memory from CONFIG_SYS_SDRAM_BASE to CONFIG_SYS_SDRAM_BASE+MIN(1GiB,bd->memsize). so how does this work on ppc systems ?
The RAM test runs before relocation to RAM, i. e. whenRAM is still not used by anything.
i didnt think calling malloc() would be OK since i need enough memory to hold one sector ...
Just grabbing a random address in RAM is certainly not a proper way to allocate I/O buffers. If you need them, and if your code design makes it even necessary to pass these buffers around (so you can not just put them on the stack which is what I would try to do) you have to use malloc().
Best regards,
Wolfgang Denk