On Thursday 10 January 2008, Stefan Roese wrote:
New: ... FLASH: 1 MB NAND: NAND device: Manufacturer ID: 0xec, Chip ID: 0x75 (Samsung NAND 32MiB 3,3V 8-bit) Scanning device for bad blocks Bad eraseblock 261 at 0x00414000 Bad eraseblock 352 at 0x00580000 Bad eraseblock 846 at 0x00d38000 Bad eraseblock 848 at 0x00d40000 32 MiB PCI: Bus Dev VenId DevId Class Int ...
Perhaps we should calme is down by using the option 'CFG_NAND_QUIET_TEST'. Also the formatting of the output is not very pretty.
Yes, we should remove those lines. I suggest to use debug() for here, so that they are printed when DEBUG is defined.
I already changed this in the NAND custodian repo.
Best regards, Stefan
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